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检索条件"主题词=Single event upset"
701 条 记 录,以下是1-10 订阅
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Techniques to Maximize Software Reliability in Radiation Fields
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 1986年 第4期33卷 1100-1102页
作者: Eichhorn, G. Piercey, R.B. Space Astronomy Laboratory University of Florida 1810 NW 6th Street Gainesville Florida 32609 Space Astronomy Laboratory University of Florida 1810 NW 6th Street Gainesville Florida 32609
Microprocessor system failures due to memory corruption by Single event upsets (SEUs) and/or latch-up in RAM or ROM memory are common in environments where there is high radiation flux. Traditional methods to harden m... 详细信息
来源: IEEE期刊 IEEE期刊 评论
Single event upset Vulnerability of Selected 4K and 16K CMOS Static RAM's
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 1982年 第6期29卷 2044-2048页
作者: W. A. Kolasinski R. Koga J. B. Blake G. Brucker P. Pandya E. Petersen W. Price Space Sciences Laboratory the Aerospace Corporation Los Angeles CA 90009 Space Sciences Laboratory the Aerospace Corporation Los Angeles CA 90009 Space Sciences Laboratory the Aerospace Corporation Los Angeles CA 90009 RCA Princeton NJ 08540 Hughes Aircraft Company Newport Beach CA 92663 Naval Research Laboratory Washington D. C. 20375 Jet Propulsion Laboratory Pasadena CA 91103
Measurements of Single event upset probability for several types of prototype bulk CMOS and CMOS/SOS RAM's have been made using beams of 140 MeV krypton, 160 MeV argon and 33 MeV oxygen ions from the Lawrence Berkeley... 详细信息
来源: IEEE期刊 IEEE期刊 评论
SEU Sensitivity of Virtex Configuration Logic
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 2005年 第6期52卷 2462-2467页
作者: Alderighi, M. monica@iasf-milano.inaf.it Candelori, A. andrea.candelori@pd.infn.it Casini, F. fabio.casini@sanitaseg.it D'Angelo, S. sergio@iasf-milano.inaf.it Mancini, M. marcello@iasf-milano.inaf.it Paccagnella, A. paccag@dei.unipd.it Pastore, S. sandro.pastore@sanitaseg.it Sechi, G. R. giacomo@iasf-milano.inaf.it Istituto Nazionale di Astrofisica Istituto di Astrofisica Spaziale e Fisica Cosmica Milano 20133 Italy. Istituto Nazionale di Fisica Nucleare 35131 Padova Italy. Sanitas EG s.r.l. 20122 Milano Italy. Dipartimento di Ingegneria dell'Informazione Università di Padova 35131 Padova Italy.
This paper presents a strategy of investigation of SEU upset mechanisms in the configuration logic of Virtex I devices. Measurement procedures specifically addressing configuration logic and a hardware set up for radi... 详细信息
来源: EBSCOBSC期刊 EBSCOBSC期刊 IEEE期刊 IEEE期刊 评论
Matrix-Based Codes for Adjacent Error Correction
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 2010年 第4期57卷 2106-2111页
作者: Argyrides, Costas A. costas@computer.orgcostas@cs.bris.ac.uk Reviriego, Pedro previrie@nebrija.es Pradhan, Dhiraj K. pradhan@cs.bris.ac.uk Maestro, Juan Antonio jmaestro@nebrija.es Department of Computer Science University of Bristol Bristol UK Departmento de Ingenieria Informatica Universidad Antonio de Nebrija Madrid Spain Department of Computer Science University of Bristol Bristol UK Departmento de Ingenieria Informatica Universidad Antonio de Nebrija Madrid Spain
Memories are one of the most widely used elements in electronic systems, and their reliability when exposed to Single events upsets (SEUs) has been studied extensively. As transistor sizes shrink, multiple cells upset... 详细信息
来源: IEEE期刊 IEEE期刊 EBSCOASC期刊 EBSCOASC期刊 EBSCOBSC期刊 EBSCOBSC期刊 评论
Charge collection spectroscopy
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 1993年 第6期40卷 1880-1887页
作者: R.A. Reed P.J. McNulty W.J. Beauvais D.R. Roth Dept. of Phys. & Astron. Clemson Univ. SC USA Dept. of Phys. & Astron. Clemson Univ. SC USA Dept. of Phys. & Astron. Clemson Univ. SC USA Dept. of Phys. & Astron. Clemson Univ. SC USA
Monitoring pulses measured between the power pins of a microelectronic device exposed to high LET (linear energy transfer) ions yields important information on the SEU (Single event upset) response of the circuit. Ana... 详细信息
来源: IEEE期刊 IEEE期刊 评论
Single event effect testing of the Intel 80386 family and the 80486 microprocessor
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 1996年 第3期43卷 879-885页
作者: A. Moran K. LaBel M. Gates C. Seidleck R. McGraw M. Broida J. Firer S. Sprehn NASA Goddard Space Flight Center Greenbelt MD USA NASA Goddard Space Flight Center Greenbelt MD USA NASA Goddard Space Flight Center Greenbelt MD USA
We present Single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both Single event upset and latchup conditions were ... 详细信息
来源: IEEE期刊 IEEE期刊 评论
Clock Buffer Circuit Soft Errors in Antifuse-Based Field Programmable Gate Arrays
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 2000年 第6期47卷 2675页
作者: Jih-Jong Wang R.B. Katz F. Dhaoui J.L. McCollum W. Wong B.E. Cronquist R.T. Lambertson E. Hamdy I. Kleyner W. Parker Actel Corp Sunnyvale CA 94086 USA NASA Goddard Space Flight Ctr Greenbelt MD 20771 USA Orbital Sci Corp Greenbelt MD 20771 USA
Three-dimensional mixed-mode device simulation is used to investigate the clock upset in an antifuse FPGA device. Two versions of the clock circuit were simulated, the original and the redesigned with improved SEU har... 详细信息
来源: EBSCOBSC期刊 EBSCOBSC期刊 EBSCOASC期刊 EBSCOASC期刊 IEEE期刊 IEEE期刊 评论
Clock, Flip-Flop, and Combinatorial Logic Contributions to the SEU Cross Section in 90 nm ASIC Technology
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 2009年 第6期56卷 3542-3550页
作者: Hansen, David L. david.l.hansen@boeing.com Miller, Eric J. eric.j.miller@boeing.com Kleinosowski, Aj aj.kleinosowski@boeing.com Kohnen, Kirk kirk.kohnen@boeing.com Le, Anthony anthony.c.le@boeing.com Dick Wong dickp.wong@boeing.com Amador, Karma karina.p.amador@boeing.com Baze, Mark mark.baze@boeing.com DeSalvo, David david.w.desalvo@boeing.com Dooley, Maryanne maryanne.dooley@boeing.com Gerst, Kenneth kenneth.m.gerst@boeing.com Hughlock, Bathe Barrie.hughlock@boeing.com Jeppson, Bradford bradford.t.jeppson@boeing.com Jobe, R. D. r.d.jobe@boeing.com Nardi, David david.j.nardi@boeing.com Ojalvo, Isabel isabel.r.ojalvo@boeing.corn Rasmussen, Brad brad.jrasmussen@boeing.corn Sunderland, David david.a.sunderland@boeing.com Truong, John john.q.truong@boeing.com Yoo, Michael michael.d.yoo@boeing.com Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Res. & Technol. Seattle WA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing MDA Space & Defense Syst. Huntington Beach CA USA Boeing Res. & Technol. Seattle WA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA Boeing Space & Intell. Syst. Los Angeles CA USA
Utilizing an application specific integrated circuit (ASIC) with 140 different shift chains, and a wide variety of test modes, a design of experiments (DOE) approach was used to characterize a commercial 90 nm CMOS te... 详细信息
来源: IEEE期刊 IEEE期刊 EBSCOASC期刊 EBSCOASC期刊 EBSCOBSC期刊 EBSCOBSC期刊 评论
C-CREST Technique for Combinational Logic SET Testing
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 2008年 第6期55卷 3347-3351页
作者: Ahlbin, J. R. jon.ahlbin@vanderbilt.edu Black, J. D. Massengill, L. W. Amusan, O. A. Balasubramanian, A. Casey, M. C. Black, D. A. McCurdy, M. W. Reed, R. A. Bhuva, B. L. Vanderbilt Univ. Nashville TN Inst. for Space & Defense Electron. Vanderbilt Univ. Nashville TN Vanderbilt Univ. Nashville TN Vanderbilt Univ. Nashville TN Vanderbilt Univ. Nashville TN Vanderbilt Univ. Nashville TN Sch. of Eng.-Office of the Dean Vanderbilt Univ. Nashville TN Inst. for Space & Defense Electron. Vanderbilt Univ. Nashville TN Vanderbilt Univ. Nashville TN Vanderbilt Univ. Nashville TN
SEUs due to combinational logic in 90 nm CMOS is analyzed at various speeds using a new design approach called the combinational circuit for radiation effects self-test (C-CREST). C-CREST allows the cross-section of c... 详细信息
来源: IEEE期刊 IEEE期刊 EBSCOBSC期刊 EBSCOBSC期刊 EBSCOASC期刊 EBSCOASC期刊 评论
Use of light-ion-induced SEU in devices under reduced bias to evaluate their SEU cross section
IEEE transactions on nuclear science;IEEE Transactions on Nu...
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IEEE transactions on nuclear science;IEEE Transactions on Nuclear Science 2004年 第6期51卷 3486-3493页
作者: Barak, J. barak@soreq.gov.il Haran, A. haran@soreq.gov.il Adler, E. Azoulay, M. azumos@soreq.gov.il Levinson, J. lev-y@zahav.net.iI Zentner, A. David, D. davidd@soreq.gov.il Fischer, B. E. B.FISCHER@gsi.de Heiss, M. Betel, D. davidb@towersemi.com Soreq Nucl. Res. Center Yavne Israel Soreq Nucl. Res. Center Yavne Israel Soreq Nucl. Res. Center Yavne Israel Soreq Nucl. Res. Center Yavne Israel Soreq Nucl. Res. Center Yavne Israel Soreq Nucl. Res. Center Yavne Israel Soreq Nucl. Res. Center Yavne Israel
Single-event upset (SEU) cross section was measured for several devices under reduced bias with light ions, in particular α-particles. The results show that α-particles can be used, in a simple manner, for testing d... 详细信息
来源: IEEE期刊 IEEE期刊 EBSCOBSC期刊 EBSCOBSC期刊 评论